2007
DOI: 10.1016/j.jcrysgro.2006.11.338
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Growth and structural properties of thick GaN layers obtained by sublimation sandwich method

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Cited by 10 publications
(10 citation statements)
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“…19,20 The lattice constants were optimized using the Perdew-Burke-Ernzerhof (PBE) functional with the van der Waals correction of density functional theory PBE-D3(BJ). The predicted lattice constants are in great agreement with the experimental values 21,22 compared to other theoretical works. 23−25 The structural relaxations are based on a k-grid density of about 0.2 Å −1 .…”
Section: ■ Computational Detailssupporting
confidence: 88%
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“…19,20 The lattice constants were optimized using the Perdew-Burke-Ernzerhof (PBE) functional with the van der Waals correction of density functional theory PBE-D3(BJ). The predicted lattice constants are in great agreement with the experimental values 21,22 compared to other theoretical works. 23−25 The structural relaxations are based on a k-grid density of about 0.2 Å −1 .…”
Section: ■ Computational Detailssupporting
confidence: 88%
“…The experimental lattice constant a used for GaN is 3.20 Å. 21 The relaxed lattice constants a of Sc 2. As displayed in Figure 2, For comparison, the experimental values 21,22 are also listed.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
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“…Herein, we report a way to obtain a micrometer sized silicon dioxide “hedgehog”‐like structure on a gallium droplet. The experimental conditions are described in detail in our previous reports . The method of obtaining such ordered structures of SiO 2 presented in this paper seems to be more effective and less complicated.…”
Section: Introductionmentioning
confidence: 89%
“…During the hydrogen measurement in a thin layer, the detection limit is restricted by the primary beam current density, which should not be too high to achieve appropriate depth resolution in the dynamic SIMS measurement. Therefore, the hydrogen detection limit for such a measurement places in the range of 10 17 -10 18 at/cm 3 as in the case of GaN:Mg layers [11,66,67]. For the GaN bulk material, the use of a primary beam with high current density can significantly lower this parameter.…”
Section: Hydrogen Measurement By Simsmentioning
confidence: 99%