“…Epitaxial EuSi 2 samples with nominal Eu coverages of 20.0 (bulk-like film), 5.0 (thin film), 1.0 (islands), and 0.26 (islands) nm, hereinafter referred to as A, B, C, and D, respectively, were prepared by deposition of metallic Eu on the vicinal Si(001) surface at 873 K and postgrowth annealing at 973 K for 10 min [30][31][32]. For the lowest coverages these growth conditions ensure the formation of islands with high surface density.…”