2014
DOI: 10.1016/j.jcrysgro.2014.09.005
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Growth and structure characterization of EuSi 2 films and nanoislands on vicinal Si(001) surface

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Cited by 11 publications
(15 citation statements)
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“…Epitaxial EuSi 2 samples with nominal Eu coverages of 20.0 (bulk-like film), 5.0 (thin film), 1.0 (islands), and 0.26 (islands) nm, hereinafter referred to as A, B, C, and D, respectively, were prepared by deposition of metallic Eu on the vicinal Si(001) surface at 873 K and postgrowth annealing at 973 K for 10 min [30][31][32]. For the lowest coverages these growth conditions ensure the formation of islands with high surface density.…”
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confidence: 99%
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“…Epitaxial EuSi 2 samples with nominal Eu coverages of 20.0 (bulk-like film), 5.0 (thin film), 1.0 (islands), and 0.26 (islands) nm, hereinafter referred to as A, B, C, and D, respectively, were prepared by deposition of metallic Eu on the vicinal Si(001) surface at 873 K and postgrowth annealing at 973 K for 10 min [30][31][32]. For the lowest coverages these growth conditions ensure the formation of islands with high surface density.…”
mentioning
confidence: 99%
“…For the lowest coverages these growth conditions ensure the formation of islands with high surface density. An additional sample labeled E, with a coverage of 0.26 nm, was prepared by Eu deposition at 673 K and postgrowth annealing at 873 K for 10 min, resulting in the formation of isolated EuSi 2 islands with low surface density [31]. The in situ nuclear inelastic scattering experiment [33,34] was performed using the ultrahigh vacuum system [35] at the Nuclear Resonance beamline ID18 [36] of the ESRF on the nuclear transition in 151 Eu with energy 21.541 keV and an energy resolution of 1.2(1) meV [37].…”
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“…vicinal substrate with a miscut of 4 towards[110]. Details of the growth procedure can be found elsewhere(Seiler et al, 2014).…”
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confidence: 99%