An amorphous phase was formed in a 0.95(Na 0.5 K 0.5 )NbO 3 -0.05CaTiO 3 (NKN-CT) film grown at 300°C, and a low-temperature transient Ca 2 Nb 2 O 7 phase was formed in the film grown at 500°C. In films grown at high temperatures (≥600°C), secondary phases such as K 5.75 Nb 10.85 O 30 and K 4 Ti 10 Nb 2 O 27 were developed without the formation of a NKN-CT phase, probably because of Na 2 O evaporation. The same secondary phases were formed in the film grown at 300°C and subsequently annealed at 850°C under an air atmosphere. However, a homogeneous NKN-CT phase was formed in films grown at 300°C and subsequently annealed at 830°C-880°C under the K 2 O and Na 2 O atmospheres. Moreover, the film annealed at 830°C in particular exhibited good electric and piezoelectric properties, including a high dielectric constant of 747 with a low dissipation factor of 0.93% at 100 kHz, low leakage current density of 2.0 3 10 -7 A/cm 2 at 0.1 MV/cm, and high P r and d 33 values of 15.4 lC/cm 2 and 124 pm/V at 100 kV/cm, respectively.