Growth Behavior of Dy/Cr Multilayers during Molecular-Beam Epitaxy and Their Structures

Abstract

We studied the growth and structures of Dy/Cr multilayers on Cr buffer layers formed on MgO substrates using a molecular-beam epitaxy technique. Reflection high-energy electron diffraction and X-ray diffraction analyses reveal that the periodic structure can be formed for various combinations of Dy and Cr layer thicknesses. The first Dy layers grow epitaxially on the Cr buffer although they are not single crystals. However, the subsequent layers become amorphous or finely crystalline for smaller thicknesses and polycrystalline for larger ones. The causes for these results are briefly discussed.

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