2006 7th International Conference on Electronic Packaging Technology 2006
DOI: 10.1109/icept.2006.359764
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Growth Behavior of IMCs and Fracture Forming Mechanism at Sn-Ag-Cu/Cu Interfaces under Thermal-Shearing Cycling Condition

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Cited by 2 publications
(2 citation statements)
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“…Ni can optimize the microstructure of solders [27,28]. Adding 0.1 wt.% Ni to Sn-3.5 Ag can greatly inhibit the growth of Ag 3 Sn during welding and subsequent solid-state aging processes [29,30]. Hammad reported that Ni elements could diffuse from the molten solder matrix into the intermetallic compound particles, forming Ni 3 Sn 4 IMCs during the solidification process, thus improving the microstructure of solders and increasing the life of electronic components [31].…”
Section: Of 18mentioning
confidence: 99%
“…Ni can optimize the microstructure of solders [27,28]. Adding 0.1 wt.% Ni to Sn-3.5 Ag can greatly inhibit the growth of Ag 3 Sn during welding and subsequent solid-state aging processes [29,30]. Hammad reported that Ni elements could diffuse from the molten solder matrix into the intermetallic compound particles, forming Ni 3 Sn 4 IMCs during the solidification process, thus improving the microstructure of solders and increasing the life of electronic components [31].…”
Section: Of 18mentioning
confidence: 99%
“…During the soldering process, metallurgical reaction between liquid solder and copper pads or pads with Ni/Au metallization forms a layer of intermetallic compound (IMC) at the solder/metallization interface. The interfacial reactions of Sn thin-film, Sn-Pb, SnAg, and Sn-Ag-Cu bulk solders with Cu pads have been investigated by a number of researchers [4][5][6][7][8][9]. They all showed that the intermetallic compounds formed during these interfacial reactions were of the Cu 3 Sn (ε) and Cu 6 Sn 5 (η) phase.…”
Section: Introductionmentioning
confidence: 99%