2023
DOI: 10.1016/j.cej.2023.146417
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Growth mechanism and structure regulation of super-elastic SiC aerogels for thermal insulation and electromagnetic wave absorption

Mingyuan Yan,
Xudong Cheng,
Lunlun Gong
et al.
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Cited by 32 publications
(3 citation statements)
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“…This resulted in an EAB value of 3.14 GHz, illustrating a broadened absorption capacity. As evidenced in Figure 3b, the peak RL of RS-1500 consistently decreased as the matching thickness increased, aligning with the principles of the quarter-wavelength theory, which suggested that the maximum absorption occurred when the material's thickness corresponded to a quarter of the incident electro-magnetic wave's wavelength [28]. The dashed line in Figure 3b represents the minimum reflection loss at different matching thicknesses, corresponding to points on the quarterwavelength line one by one, in accordance with the quarter-wavelength theory.…”
Section: Ema Performance Of Rf/sio 2 Ceramic Particlessupporting
confidence: 75%
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“…This resulted in an EAB value of 3.14 GHz, illustrating a broadened absorption capacity. As evidenced in Figure 3b, the peak RL of RS-1500 consistently decreased as the matching thickness increased, aligning with the principles of the quarter-wavelength theory, which suggested that the maximum absorption occurred when the material's thickness corresponded to a quarter of the incident electro-magnetic wave's wavelength [28]. The dashed line in Figure 3b represents the minimum reflection loss at different matching thicknesses, corresponding to points on the quarterwavelength line one by one, in accordance with the quarter-wavelength theory.…”
Section: Ema Performance Of Rf/sio 2 Ceramic Particlessupporting
confidence: 75%
“…Additionally, XPS analysis was employed to investigate the chemical structure of the products obtained at different heat treatment temperatures, particularly quantitatively analyzing the structural changes of silicon elements at different heat treatment temperatures. As shown in Figure 1f-h, all three samples exhibited distinct O-Si-O peaks, indicating the formation of SiO 2 [28,33]…”
Section: Structural Control Of Rf/sio 2 Ceramic Particlesmentioning
confidence: 84%
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