2014
DOI: 10.1016/j.surfcoat.2014.07.061
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Growth mechanism of hydrogenated amorphous carbon films: Molecular dynamics simulations

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Cited by 10 publications
(10 citation statements)
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“…This corroborates the relation between H and sp 2 cluster size, which impact on E T especially in thermal treatment lower than 450 º C as reported [24], [39], [40]. On the other hand, bandgap decreased at region > 450 º C, this can be attributed to changes in sp 3 Again, these results are consistent with published work [7], [23], [41].…”
Section: Optical Bandgap Of A-c:hsupporting
confidence: 91%
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“…This corroborates the relation between H and sp 2 cluster size, which impact on E T especially in thermal treatment lower than 450 º C as reported [24], [39], [40]. On the other hand, bandgap decreased at region > 450 º C, this can be attributed to changes in sp 3 Again, these results are consistent with published work [7], [23], [41].…”
Section: Optical Bandgap Of A-c:hsupporting
confidence: 91%
“…The k values of a-C:H decreases from 2.6 for as-deposited film to 2.5 when annealed at 450 º C, this is a clear indication of the stability of films at temperatures below 450 º C, it decreases to 2.2 at higher annealing temperatures >450 º C. As a result of this, it is justifiable that a-C:H films show a transition at temperatures above 450 º C, which is in accord with other published work [11], [23]. Annealing a-C:H films at temperatures above the transition temperature (450 º C) leads to the graphitization conversion of C-C sp 3 bonded carbon to C-C sp 2 bonded carbon, and therefore leads to the release of compressive stress in the film [31]. Since the dielectric constant is proportional to stress or compactness in the film, the decreased value of k at a temperature above 450 º C results from the stress release in the films or films are becoming less compact [1], [32].…”
Section: Dielectric Constant (K) Of A-c:h Filmsupporting
confidence: 87%
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