Comprehensive Semiconductor Science and Technology 2011
DOI: 10.1016/b978-0-44-453153-7.00093-6
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Growth of Bulk GaN Crystals

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(1 citation statement)
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“…The dislocation density reported for the high Al-content AlGaN epilayers grown on the single crystalline AlN substrates (by migration enhanced metalorganic chemical vapour deposition (MEMOCVD)) are in the range of 10 6 cm −1 , 48 and further the epilayers were of excellent crystalline quality. However, unlike GaN substrate development, [49][50][51][52] the bulk AlN substrate technology is still in the development. Although bulk AlN has the highest crystalline quality, its lack of low-cost large-diameter materials is preventing it from being widely employed in commercial production of devices and cost sensitive products.…”
Section: Ultra-wide Bandgap Material-alnmentioning
confidence: 99%
“…The dislocation density reported for the high Al-content AlGaN epilayers grown on the single crystalline AlN substrates (by migration enhanced metalorganic chemical vapour deposition (MEMOCVD)) are in the range of 10 6 cm −1 , 48 and further the epilayers were of excellent crystalline quality. However, unlike GaN substrate development, [49][50][51][52] the bulk AlN substrate technology is still in the development. Although bulk AlN has the highest crystalline quality, its lack of low-cost large-diameter materials is preventing it from being widely employed in commercial production of devices and cost sensitive products.…”
Section: Ultra-wide Bandgap Material-alnmentioning
confidence: 99%