1986
DOI: 10.1063/1.97550
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Growth of Cd1−xZnxTe by molecular beam epitaxy

Abstract: Cd1−xZnxTe has been grown on GaAs substrates for compositions from x=0 to x=1. Binaries are shown to be of high quality, but x-ray rocking curve half-widths are extremely broad for most ternary compositions. Attempts to modify the interface yield only modest and uneven improvement in rocking curve half-widths. The poor quality appears to be due to a phase separation.

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Cited by 53 publications
(9 citation statements)
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“…XRD rocking curves of the buffer layers and cap layers showed single-crystalline (112) material with linearly graded in-plane and out-of-plane lattice parameters, suggesting fully relaxed buffer layers with final cap compositions close to intended values. As observed in earlier work with nongraded Cd 1ÿ x Zn x Te layers, 10 the XRD rocking curve FWHM of the uniform Cd 1ÿ x Zn x Te cap layers increased with increasing Cd concentration. For x ; 0.2, FWHM could not be measured because the intensity of the (224) reflection peak was below detector limits.…”
Section: Resultssupporting
confidence: 68%
See 1 more Smart Citation
“…XRD rocking curves of the buffer layers and cap layers showed single-crystalline (112) material with linearly graded in-plane and out-of-plane lattice parameters, suggesting fully relaxed buffer layers with final cap compositions close to intended values. As observed in earlier work with nongraded Cd 1ÿ x Zn x Te layers, 10 the XRD rocking curve FWHM of the uniform Cd 1ÿ x Zn x Te cap layers increased with increasing Cd concentration. For x ; 0.2, FWHM could not be measured because the intensity of the (224) reflection peak was below detector limits.…”
Section: Resultssupporting
confidence: 68%
“…10 X-ray diffraction peak half-widths and surface quality were observed to degrade as Cd content was increased from 0% to 80%. 10 Phase separation into Cd-rich (111) and Zn-rich (001) phases was suggested as a possible explanation for this behavior. Chemical vapor deposition (CVD) of Cd 1ÿ x Zn x Te films with 0 x 1 has been reported on (001) GaAs 11 and (001) and (111) Si samples.…”
Section: Introductionmentioning
confidence: 96%
“…These superlattices (grown on a GaAs substrate) provide a straightforward control of the effective lattice constant of the system, and thus the strain in the subsequently grown HgTe layers. The use of SLS rather than (Cd,Zn)Te solid solutions for lattice constant control is necessary because solid solutions suffer from poor crystal quality due to phase separation effects [8,9]. We fabricate both tensile (ε < 0) and compressively (ε > 0) strained QWs using coherent epitaxy of (Zn,Cd,Hg)Te -HgTe -(Zn,Cd,Hg)Te heterostructures on virtual substrates.…”
mentioning
confidence: 99%
“…A typical θ-2θ spectrum obtained for a Cd 1-x Zn x Te specimen is shown in Fig. 7 The lattice parameters for all samples were calculated from their respective x-ray spectra, and these values were then used to derive their alloy compositions using Vegard's law. The intense narrow peak on the right represents the (004) reflection from the GaAs substrate, and the peak to the left of it corresponds to Cd 1-x Zn x Te (004) Bragg planes.…”
Section: Mbe Growth and X-ray Resultsmentioning
confidence: 99%