2004
DOI: 10.1016/j.jcrysgro.2004.05.039
|View full text |Cite
|
Sign up to set email alerts
|

Growth of In-rich InGaN/GaN quantum dots by metalorganic chemical vapor deposition

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
10
0

Year Published

2005
2005
2013
2013

Publication Types

Select...
8
1

Relationship

2
7

Authors

Journals

citations
Cited by 30 publications
(11 citation statements)
references
References 13 publications
1
10
0
Order By: Relevance
“…Besides strain relaxation, the effect of quantum confinement also plays an important role in the optical behaviour of a nanopost. The dimensions of the InGaN regions in our nanoposts are actually comparable to those of the quantum dots grown with the Stranski-Krastanov mode [16,17]. To estimate the effects of 3D quantum confinement in the nanoposts, we performed the numerical calculation for the effective band gap of an InGaN/GaN quantum disc 3 nm in thickness.…”
Section: Discussionmentioning
confidence: 99%
“…Besides strain relaxation, the effect of quantum confinement also plays an important role in the optical behaviour of a nanopost. The dimensions of the InGaN regions in our nanoposts are actually comparable to those of the quantum dots grown with the Stranski-Krastanov mode [16,17]. To estimate the effects of 3D quantum confinement in the nanoposts, we performed the numerical calculation for the effective band gap of an InGaN/GaN quantum disc 3 nm in thickness.…”
Section: Discussionmentioning
confidence: 99%
“…The average layer thickness and the indium incorporation as a function of growth temperatures were investigated by analyzing o/2y X-ray scan from (0002) reflections. Since the position of the InGaN peak relative to GaN peak in X-ray spectra depends on indium content as well as on the strain in InGaN layer, the strain was independently extracted from reciprocal space map (RSM) from an asymmetric reflection (10)(11)(12)(13)(14)(15). It should be noted that diffracted intensity around (10-15) reflection from InGaN layer was very poor, and hence recoding the RSM was not easy for thin InGaN layers.…”
Section: Growth Of Ingan Qdsmentioning
confidence: 99%
“…The growth temperature of InGaN QDs was 650 C. The In composition in our thick InGaN layers was $80%, as determined by electron probe micro-analysis (EPMA) and X-ray diffraction (XRD). 13) The optical properties of InGaN/GaN nanostructures were characterized by photoluminescence (PL) and cathodoluminescence (CL). PL experiments were performed using a HeCd laser (325 nm) as a pumping source.…”
Section: Methodsmentioning
confidence: 99%