Growth of laser damage on the input surface of SiO 2 at 351 nm

Norton, Mary A.; Donohue, Eugene E.; Feit, Michael D.; Hackel, Richard P.; Hollingsworth, William G.; Rubenchik, Alexander M.; Spaeth, M. L.

doi:10.1117/12.696085

Cited by 40 publications

(15 citation statements)

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“…The previously developed notion of probability of growth is not sufficient to describe the growth behavior of the damage sites. In the present study, the damage sites are located on the exit surface of silica, and grow exponentially with respect to the number of laser pulses [25]. Thereby, the damage area after n laser pulses (noted A n ) can be written as…”

Section: Discussionmentioning

confidence: 94%

“…Contrary to the linear growth of the damage sites on the entrance surface, the area of the ones located on the exit surface is known to scale exponentially with the number of laser pulses [25], which may originate from the absence of a plasma shielding of the surface from the laser flux [26]. In our experiments, we have used millimetric and Gaussian-shaped laser beams.…”

Section: Introductionmentioning

confidence: 99%

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Investigations on laser damage growth in fused silica with simultaneous wavelength irradiation

et al. 2015

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The laser-induced damage growth phenomenon is experimentally studied for damage sites on the exit surface of fused silica. The sites are irradiated by nanosecond laser pulses at 1064 and 355 nm separately and also simultaneously. The results in the single wavelength configurations are expressed in terms of the probability of growth and growth coefficient. For growing sites, a fluence correction expression is proposed in order to take into account the millimetric Gaussian profile of the beams. The use of this expression is necessary to obtain results that are consistent with the ones obtained in the existing literature with large homogeneous beams. In the multiple wavelengths configuration, the results are expressed as a function of the laser fluences at each wavelength and are found to be closely related to the parameters determined in the single wavelength experiments. A coupling between the two wavelengths is quantified, and could originate from the formation and the expansion of a plasma produced both in the center and at the periphery of the damage sites.

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Section: Discussionmentioning

confidence: 94%

Section: Introductionmentioning

confidence: 99%

Investigations on laser damage growth in fused silica with simultaneous wavelength irradiation

et al. 2015

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“…First studies realized with spatially Gaussian small beams (millimeter sized) showed the growth generality (at 1x and 3x) and behaviors much more pronounced in the rear face than in the front one. Indeed, front surface growth rate is limited and characterized by a linear growth shot after shot [3]. Observations on the Beamlet laser and the first experimentations on the OSL facility at Livermore [4] revealed the fundamental aspect from an operational point of view: the exponential nature of the growth shot after shot for exit surface damage.…”

Section: Introductionmentioning

confidence: 99%

Damage growth in fused silica optics at 351 nm: refined modeling of large-beam experiments

et al. 2013

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Up to now, laser damage growth on the exit surface of fused silica optics has been mainly considered as exponential, the growth coefficient depending essentially on fluence. From experiments with large beams carried out at 351 nm under nanosecond pulses, a statistical analysis is conducted leading to a refined representation of the growth. The effect of several parameters has been taken into account to describe precisely the growth phenomenon. The two principal parameters proved to be the mean fluence and the size of the damage sites. Nevertheless, contributions of other parameters have been estimated too: the number of neighbors around the damage site, the shot number, etc. From experimental results, a model smoothed on a statistical approach is developed that permits the description of a complete sequence of growth. To evaluate the relevance of the modeling approach, the occluded area estimated from modeling is compared with the ones experimentally measured. For this purpose, numerical growth methods have been developed too. It is shown that the approach outlined is appropriate for a more precise description of the growth.

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“…However, this application is limited by the laser induced damage at high laser fluences. It has been demonstrated that the surface damage threshold of silica is far below the intrinsic bulk limit of the material [1][2][3][4][5][6][7][8]. Recent work has also shown that the laser induced surface damage in fused silica is due to surface and sub-surface defects (damage precursors) which can absorb sub-bandgap light [9,10].…”

Section: Introductionmentioning

confidence: 99%

Photothermal microscopic studies of surface and subsurface defects on fused silica at 355nm

Chen¹,

Dong²,

Zhang³

et al. 2014

SPIE Proceedings

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It is believed that surface and subsurface defects formed during standard grinding and polishing processes are mainly responsible for laser induced damage in fused silica. The correlation between the laser damage susceptibility and absorption property of these defects has not been totally understood. In this paper, we present the characterization of surface and subsurface defects of fused silica by measuring their absorption properties based on a photothermal technique at 355 nm. The photothermal microscopic imaging reveals that the surface/subsurface absorption defects in fused silica can be identified. In addition, a 3D photothermal imaging of a laser damage site on the silica is also obtained. Our results demonstrate that photothermal microscopy is a powerful tool for defect characterization of optical materials for high power laser applications.

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Growth of laser damage on the input surface of SiO 2 at 351 nm

Cited by 40 publications

References 0 publications

Investigations on laser damage growth in fused silica with simultaneous wavelength irradiation

Investigations on laser damage growth in fused silica with simultaneous wavelength irradiation

Damage growth in fused silica optics at 351 nm: refined modeling of large-beam experiments

Photothermal microscopic studies of surface and subsurface defects on fused silica at 355nm

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