1993
DOI: 10.1016/0022-0248(93)90213-g
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Growth of MgTe and Cd1−xMgxTe thin films by molecular beam epitaxy

Abstract: We report on the growth of the compound semiconductor MgTe as weil as the ternary alloy Cd l ~xMg,Tc by mokcular hcam cpitaxy. This is to our knowkdgc thc first time that this material has heen grown by any epitaxial technique. Bulk MgTe, which is hygroscopic, has a band gap of 3.0 eV and crystallizcs usually in thc wurtzite structure. Pseudomorphic films were grown on zincblende Cd Te suhstrates for a MgTe thickness helow a critical layer thickncss of approximately 500 nm. In addition, Cdl_,MgxTe epilayers we… Show more

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Cited by 123 publications
(35 citation statements)
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“…Our dependence of the lattice constant versus actual Mg content can be described by the following equation: α = 6.481 -0.071x. (1) The zinc blende lattice constant of MgTe was found to be 6.41 Α by extrapolation of the above equation, which is lower than that reported by Waag et al (6.435 Å) for MBE (molecular beam epitaxy) grown thin films [6]. As it is seen in Fig.…”
Section: Resultsmentioning
confidence: 65%
“…Our dependence of the lattice constant versus actual Mg content can be described by the following equation: α = 6.481 -0.071x. (1) The zinc blende lattice constant of MgTe was found to be 6.41 Α by extrapolation of the above equation, which is lower than that reported by Waag et al (6.435 Å) for MBE (molecular beam epitaxy) grown thin films [6]. As it is seen in Fig.…”
Section: Resultsmentioning
confidence: 65%
“…They are used in various commercial applications in electronics, visual displays high density optical memories, solid state laser devices, photo detectors [1,2]. MgSe crystallizes in the zinc-blende (ZB), wurzite (WZ) and rock-salt (RS) structures [3].…”
Section: Introductionmentioning
confidence: 99%
“…The ternary wide-gap semiconductor (CdMg)Te seems to be a promising candidate for optoelectronic devices for the whole visible range of light [1]. (CdMg)Te has been found to be suitable for optoelectronics, already demonStrated in 1967 by the fabrication of an electroluminescent diode [2], but the crystal growth and the purity of the base materials turned out to be critical [3].…”
Section: Introductionmentioning
confidence: 99%
“…(CdMg)Te has been found to be suitable for optoelectronics, already demonStrated in 1967 by the fabrication of an electroluminescent diode [2], but the crystal growth and the purity of the base materials turned out to be critical [3]. By the use of molecular beam epitaxy (MBE) (CdMg)Te has recently been produced aS high quality thin films on (CdZn)Te substrates [1]. The lattice mismatch between CdTe and zinc blende MgTe has been found to be as low as 1% at room temperature.…”
Section: Introductionmentioning
confidence: 99%