“…As a result, if the MWCVD process can be applied for the epitaxial growth of 3C‐SiC on Si, the large‐scale fabrication of high‐quality, single‐crystalline, 3C‐SiC film might become a reality, however, even though MWCVD‐based techniques (i.e. electron‐cyclotron‐resonance MWCVD, remote plasma MWCVD) have previously been applied to deposit 3C‐SiC films, only polycrystalline and amorphous SiC films have been obtained, and no epitaxial growth has been achieved 29–33. Therefore, in the present study, we address, for the first time, the possibility of utilizing MWCVD to achieve the low‐temperature, epitaxial growth of 3C‐SiC films on Si wafers.…”