With
the rise of two-dimensional (2D) transition-metal dichalcogenide
(TMD) semiconductors and their prospective use in commercial (opto)electronic
applications, it has become key to develop scalable and reliable TMD
synthesis methods with well-monitored and controlled levels of impurities.
While metal–organic chemical vapor deposition (MOCVD) has emerged
as the method of choice for large-scale TMD fabrication, carbon (C)
incorporation arising during MOCVD growth of TMDs has been a persistent
concernespecially in instances where organic chalcogen precursors
are desired as a less hazardous alternative to more toxic chalcogen
hydrides. However, the underlying mechanisms of such unintentional
C incorporation and the effects on film growth and properties are
still elusive. Here, we report on the role of C-containing side products
of organosulfur precursor pyrolysis in MoS2 thin films
grown from molybdenum hexacarbonyl Mo(CO)6 and diethyl
sulfide (CH3CH2)2S (DES). By combining in situ gas-phase monitoring with ex situ microscopy and spectroscopy analyses, we systematically investigate
the effect of temperature and Mo(CO)6/DES/H2 gas mixture ratios on film morphology, chemical composition, and
stoichiometry. Aiming at high-quality TMD growth that typically requires
elevated growth temperatures and high DES/Mo(CO)6 precursor
ratios, we observed that temperatures above DES pyrolysis onset (≳600
°C) and excessive DES flow result in the formation of nanographitic
carbon, competing with MoS2 growth. We found that by introducing H2 gas to the process,
DES pyrolysis is significantly hindered, which reduces carbon incorporation.
The C content in the MoS2 films is shown to quench the
MoS2 photoluminescence and influence the trion-to-exciton
ratio via charge transfer. This finding is fundamental
for understanding process-induced C impurity doping in MOCVD-grown
2D semiconductors and might have important implications for the functionality
and performance of (opto)electronic devices.