Growth of ultrathin In layers on W(1 1 0) studied by high-resolution electron spectroscopies

Burgener, Matthias; Bukaluk, A.; Cyrankiewicz, Michał; Goldmann, A.; Siuda, R.; Trzciński, Marek

doi:10.1016/s0039-6028(03)00305-4

Cited by 9 publications

(14 citation statements)

References 19 publications

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“…In our studies we registered UPS spectra of Ag 4d and In 4d lines by using He(I) and He(II) monochromatised radiation. The Ag 4d spectrum revealed two most prominent lines observed at 4.55 ± 0.05 eV and 4.93 ± 0.05 eV, corresponding to photoemission from the Ag 4d valence orbitals, in good agreement with the results obtained earlier for the Ag/W(110) system [9,[21][22][23]. In the In 4d spectrum one could notice two distinct lines corresponding to 4d 5/2 and 4d 3/2 transitions in indium.…”

Section: Surface Diffusion Of In Atoms On the Polycrystalline Tungstesupporting

confidence: 90%

“…Spin-orbit splitting of about 0.9 eV was in reasonable agreement with other studies [24,25] performed for bulk alloys. Binding energy of the 4d 5/2 line was compatible with our previous XPS studies of In growth on the W(110) [9].…”

Section: Surface Diffusion Of In Atoms On the Polycrystalline Tungstesupporting

confidence: 89%

“…is the cross-section ratio and a is the tungsten bulk lattice constant [9]. Silver was also evaporated from the PBN crucible at the same rate as indium, i.e.…”

Section: Methodsmentioning

confidence: 99%

“…vious papers we have studied mechanism of growth of In ultrathin layers on the W(110) by means of photoelectron spectroscopy combined with low energy electron diffraction (LEED) [9], and by scanning tunnelling microscopy (STM) and LEED methods [10]. Preliminary studies of In diffusion on W(110) surface [11] as well as intermixing in the In/Ag/W(110) and Ag/In/W(110) structures [12] have also been performed.…”

Section: S-19mentioning

confidence: 99%

“…In description of the resulting surface structure we used convenient notation, introduced in our previous paper [9]: Ag x In 1−x denoted In-Ag structure, in which x indicated the relative amount of Ag present on the surface, whereas the total coverage (Ag+In) was given in brackets. It is necessary to indicate that this notation does not contain information neither on the overlayer geometry nor the degree of possible alloying.…”

Section: Surface Diffusion Of In Atoms On the Polycrystalline Tungstementioning

confidence: 99%

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Study of Ultrathin In-Ag Layers οn Tungsten by Means of Surface Spectroscopy Techniques

2008

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Auger electron spectroscopy, X-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy, scanning tunnelling microscopy, low energy electron diffraction, and thermodesorption methods were used to investigate the process of growth of ultrathin In films and formation of In-Ag surface alloys on tungsten substrate. Several indium layers, having coverage ranging from 0.2 to 0.8 ML were deposited on tungsten substrate in room temperature. It was found that at the lowest coverages (Θ = 0.1-0.3 ML) indium atoms form (3 × 1) structure, characterized by very sharp low energy electron diffraction patterns. With increasing Θ they tend to form densely packed islands interpreted as slightly distorted In(111) monolayers. Surface diffusion of In onto the tungsten surface was studied by using ESCA imaging property of SCIENTA ESCA200 instrument. Measuring the photoelectron intensity as a function of two spatial coordinates and the energy, we observed movement of In atoms on the tungsten surface. On the basis of the change of surface coverage with distance surface the diffusion coefficient was evaluated at the temperature range of 400-700 K. Intermixing of ultrathin films of indium and silver, after their surface diffusion from the sample edges to the centre of the tungsten surface, were observed by using X-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy and the Auger electron spectroscopy methods. Intermixing was controlled by means of photoemission spectra from the valence states and the In 4d level, as well as by X-ray photoelectron spectroscopy studies of indium and silver core levels excited by Al Kα source.

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Section: Surface Diffusion Of In Atoms On the Polycrystalline Tungstesupporting

confidence: 90%

Section: Surface Diffusion Of In Atoms On the Polycrystalline Tungstesupporting

confidence: 89%

“…is the cross-section ratio and a is the tungsten bulk lattice constant [9]. Silver was also evaporated from the PBN crucible at the same rate as indium, i.e.…”

Section: Methodsmentioning

confidence: 99%