2019
DOI: 10.1002/pssb.201900521
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Growth Temperature Effects of Chemical Vapor Deposition‐Grown Boron Nitride Layer Using B2H6 and NH3

Abstract: The boron nitride (BN) thin films on Al2O3 substrates grown by chemical vapor deposition (CVD) using alternating supply of B2H6 and NH3 are investigated. A significant reduction in growth rates is observed when the growth temperature (Tg) is decreased from 1360 to 1140 °C, indicating incomplete decomposition of B2H6. The 2θ/ω scans of high‐resolution X‐ray diffraction (HRXRD) reveal that the intensity ratio of 2θ = 26.7°/54.0° is 16, which is close to the theoretical intensity ratio for hexagonal BN (h‐BN) of … Show more

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Cited by 8 publications
(21 citation statements)
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“…During this period, there was no BN growth, but a thin AlON layer (≈1 nm) was formed under NH 3 exposure. [ 7 ]…”
Section: Resultsmentioning
confidence: 99%
See 4 more Smart Citations
“…During this period, there was no BN growth, but a thin AlON layer (≈1 nm) was formed under NH 3 exposure. [ 7 ]…”
Section: Resultsmentioning
confidence: 99%
“…[ 35 ] As a result, the induced compressive strain in the BN layer was released when the wafer cooled down from T g to RT. The size and height of the wrinkles strongly depend on the film thickness, [ 7 ] which is, in turn, related to the compressive strain in the BN layer. The size and height of the wrinkles obtained using TMB are slightly larger than those obtained using B 2 H 6 .…”
Section: Resultsmentioning
confidence: 99%
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