2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2016
DOI: 10.1109/radecs.2016.8093144
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Guarded dual rail logic for soft error tolerant standard cell library

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Cited by 6 publications
(2 citation statements)
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“…This is reliable but has high area, performance, and power penalties. Dual-mode and dualrail versions use two copies of the logic followed by a Muller C-element that waits until both copies agree before firing [8], [21] and are also costly. Alternatively, gates and storage elements can be sized to minimize the risk of soft-errors [10]- [12].…”
Section: Related Workmentioning
confidence: 99%
See 1 more Smart Citation
“…This is reliable but has high area, performance, and power penalties. Dual-mode and dualrail versions use two copies of the logic followed by a Muller C-element that waits until both copies agree before firing [8], [21] and are also costly. Alternatively, gates and storage elements can be sized to minimize the risk of soft-errors [10]- [12].…”
Section: Related Workmentioning
confidence: 99%
“…To circumvent the effects of these types of radiation, numerous Radiation Hardened by Design (RHBD) techniques have been proposed in the literature, the most common being the Triple Modular Redundancy (TMR) [7], Guarded Dual Modular Redundancy (GDMR) [8], gate sizing [9]- [12], and Glitch Filtering (GF) [13]- [15]. RHBD cell libraries have also been developed for both asynchronous and synchronous designs [16], [17].…”
Section: Introductionmentioning
confidence: 99%