2018 IEEE 36th International Conference on Computer Design (ICCD) 2018
DOI: 10.1109/iccd.2018.00073
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Guiding RTL Test Generation Using Relevant Potential Invariants

Abstract: the opportunity to engage in his research. From the time of my applications to VT, I have been inspired by Dr. Hsiao's experience and contributions in the field and was lucky enough to have him as my interim advisor. His courses on "Electronic Design Automation" and "Testing and Verification" motivated me further to definitely pursue my Master's thesis under his guidance. Throughout my thesis, he guided and encouraged my work. I am

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