Abstract. The evaporation flux Jev(H2O) of H2O
from HCl-doped typically 1.5 µm or so thick vapor-deposited
ice films has been measured in a combined quartz crystal
microbalance (QCMB)–residual gas mass spectrometry (MS) experiment.
Jev(H2O) has been found to show complex behavior and to
be a function of the average mole fraction χHCl of HCl in
the ice film ranging from 6×1014 to
3×1017 molecule cm−2 s−1 at 174–210 K for initial
values χHCl0 ranging from 5×10-5 to
3×10-3 at the start of the evaporation. The dose of HCl on
ice was in the range of 1 to 40 formal monolayers and the H2O vapor
pressure was independent of χHCl within the measured range and
equal to that of pure ice down to 80 nm thickness. The dependence of
Jev(H2O) with increasing average χHCl was
correlated with (a) the evaporation range rb∕e
parameter, that is, the ratio of Jev(H2O) just before HCl
doping of the pure ice film and Jev(H2O) after observable
HCl desorption towards the end of film evaporation, and (b) the
remaining thickness dD below which Jev(H2O)
decreases to less than 85 % of pure ice. The dependence of
Jev(H2O) with increasing average χHCl from
HCl-doped ice films suggests two limiting data sets, one associated
with the occurrence of a two-phase pure ice/crystalline HCl hydrate binary
phase (set A) and the other with a single-phase amorphous HCl∕H2O
binary mixture (set B). The measured values of Jev(H2O)
may lead to significant evaporative lifetime extensions of
HCl-contaminated ice cloud particles under atmospheric conditions,
regardless of whether the structure corresponds to an amorphous or
crystalline state of the HCl∕H2O aggregate.