2005
DOI: 10.1016/j.msea.2005.02.091
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Hall–Petch revisited

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Cited by 85 publications
(54 citation statements)
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“…The hardness, unlike the Young modulus, is more sensitive to the microstructure, as suggested by some deformation models of nanoindentation [33,34] and by the Hall-Petch relationship [35]. In 316L thin film (F0- Figure 5) the hardness is higher than the one of the bulk 316L which can be attributed to the smaller grain size [35].…”
Section: Resultsmentioning
confidence: 96%
“…The hardness, unlike the Young modulus, is more sensitive to the microstructure, as suggested by some deformation models of nanoindentation [33,34] and by the Hall-Petch relationship [35]. In 316L thin film (F0- Figure 5) the hardness is higher than the one of the bulk 316L which can be attributed to the smaller grain size [35].…”
Section: Resultsmentioning
confidence: 96%
“…[21,22] If one assumes that in a nanocrystalline metal all macroscopic plasticity is carried by dislocations emitted from, and subsequently absorbed in, GBs, [23,24] only 4 % of the grains would have deformed plastically at the 0.2 % yield stress. [25] In other words, a nanocrystalline structure deforms more heterogeneously than a coarse-grained polycrystal.In the present work we show, through analysis of X-ray diffraction (XRD) spectra measured during in situ deformation of nanocrystalline and ultrafine-grained Ni, that the amount of strain assigned to microplasticity can significantly exceed the usual 0.2 % definition of the macroscopic yield stress when grain sizes reach the nanometer range.XRD profile analysis is a well-known technique for microstructural analysis, where the broadening of the diffraction peaks result from limitations in the spatial extent of the coherent scattering volumes (in our case, the grain size) and the presence of inhomogeneous strain. The first type of broadening is diffraction-order independent, whereas the second is order dependent.…”
mentioning
confidence: 99%
“…The physical reason of improved mechanical properties lies in the higher grain boundary volume in fine-grained structures, which makes the dislocation motion and resulting plastic deformation more difficult. For many materials the yield stress follows the Hall-Petch equation in a very broad range of grain size between 1 μm and 1 mm (Saada, 2005). Deviations from this law are observed only for very coarse grained and for nano-grained structures.…”
Section: Ultrafine-grained Coppermentioning
confidence: 98%