Hard x-ray nanofocusing by multilayer Laue lenses

Yan, Hongyuan; Conley, Ray; Bouet, Nathalie; Chu, Yong S.

doi:10.1088/0022-3727/47/26/263001

Cited by 119 publications

(72 citation statements)

References 143 publications

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“…Meeting the damage-limited resolution in biological samples of a few tens of nanometers, as discussed in this paper, needs a lens capable of producing a focal spot of about 10-nm width. The most suitable devices for achieving such spot sizes at these photon energies and with high efficiency are multilayer Laue lenses (MLLs) [35]. These are volume zone plates, made by cutting a structure from Research Article a film made from many thousands of alternating layers of materials produced by sputter deposition.…”

Section: Conceptual Setupmentioning

confidence: 99%

Dose efficient Compton X-ray microscopy

Villanueva-Pérez¹,

Bajt²,

Chapman³

2018

Optica

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X-ray imaging techniques have proven invaluable to study biological systems at high resolution due to the penetration power and short wavelength of this radiation. In practice, the resolution and sensitivity of current X-ray imaging techniques are not limited by the performance of optics or image-recovery methods but by radiation damage. We propose the use of Compton (inelastic) X-ray scattering for high-resolution cellular imaging and provide a study of a scanning microscope geometry that requires a dose to achieve a given resolution that is three orders of magnitude lower than for coherent (elastic) scattering. We find that the dose per imaging signal is minimized at a photon energy of 64 keV. This corresponds to a short enough wavelength (0.02 nm) to provide nanometer transverse resolution and micrometer depth of field for tomographic imaging of whole cells. The microscope could be implemented at future high-energy and high-brightness synchrotron-radiation facilities to provide images of unsectioned and unlabeled cells in their native conditions at enough detail to bridge the techniques of super-resolution optical microscopy and cryo-electron microscopy. © 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement OCIS codes: (110.7440) X-ray imaging; (340.7460) X-ray microscopy; (170.3880) Medical and biological imaging.

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Section: Conceptual Setupmentioning

confidence: 99%

Dose efficient Compton X-ray microscopy

Villanueva-Pérez¹,

Bajt²,

Chapman³

2018

Optica

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“…This is larger than the required 17.5 μm MLL height since the MLL is sliced at a point in the penumbra where the rate is lower, as discussed in Sec. 4.…”

Section: Multilayer Depositionmentioning

confidence: 99%

“…A recent review paper by Yan et al [4] gives the current status of the development of MLLs. The first transmissive structures that were fabricated by layer deposition were thick gratings and zone plates prepared by depositing a multilayer onto a flat substrate [5] or on a thin cylindrical wire [6] and then slicing it to the desired depth along the optic axis.…”

Section: Introductionmentioning

confidence: 99%

Fabrication of wedged multilayer Laue lenses

Prasciolu¹,

Leontowich²,

Krzywiński³

et al. 2015

Opt. Mater. Express

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We present a new method to fabricate wedged multilayer Laue lenses, in which the angle of diffracting layers smoothly varies in the lens to achieve optimum diffracting efficiency across the entire pupil of the lens. This was achieved by depositing a multilayer onto a flat substrate placed in the penumbra of a straight-edge mask. The distance between the mask and the substrate was calibrated and the multilayer Laue lens was cut in a position where the varying layer thickness and the varying layer tilt simultaneously satisfy the Fresnel zone plate condition and Bragg's law for all layers in the stack. This method can be used to extend the achievable numerical aperture of multilayer Laue lenses to reach considerably smaller focal spot sizes than achievable with lenses composed of parallel layers.

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“…Recently, X-ray focusing devices such as Fresnel zone plates (FZPs) and Kirkpatrick-Baez mirrors achieving a focused beam size of around 10 nm are being developed as key technologies in the X-ray microscopy [1,2]. The FZP is a circular transmission diffraction grating consisting of alternate transparent and opaque zones whose boundaries are set according to Fresnel zone configuration.…”

Section: Introductionmentioning

confidence: 99%

Upgrading multilayer zone plate technology for hard x-ray focusing

Hirotomo

Takano

Sumida

et al. 2016

AIP Conference Proceedings

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Hard x-ray nanofocusing using total-reflection zone plates AIP Conference Proceedings 1696, 020039 (2016) Abstract. Multilayer zone plate (MZP) technology for hard X-ray focusing was upgraded and its focusing performance was evaluated using 20-keV X-rays at the synchrotron beamline (BL24XU) of SPring-8. The MZP consists of MoSi2 and Si layers alternately deposited on a glass fiber by magnetron sputtering so that all zone boundaries satisfy the Fresnel zone configuration. The focused beam was evaluated using knife-edge scanning in which the measured intensity distribution is identical to the line spread function (LSF) in the focal plane. The focused beamsize of about 30 nm was estimated by oscillation peaks observed in the measured LSF according to Rayleigh's criterion.

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Hard x-ray nanofocusing by multilayer Laue lenses

Cited by 119 publications

References 143 publications

Dose efficient Compton X-ray microscopy

Dose efficient Compton X-ray microscopy

Fabrication of wedged multilayer Laue lenses

Upgrading multilayer zone plate technology for hard x-ray focusing

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