Hard X-ray nanoprobe to study the emission properties of Ce-doped YAG wafer by using XEOL and TR-XEOL

Li, Yi-Chen; Huang, Tzu-Chi; Wu, Yu-Hao; Wei, Wei-Lon; Wu, Tai-Sing; Chang, Lo-Yeuh; Lee, Chien-Yu; Chen, Bo-Yi; Yin, Gung-Chian; Tang, Mau-Tsu; Lin, Bi-Hsuan

doi:10.1016/j.optmat.2024.116031

Optical Materials

2024

DOI: 10.1016/j.optmat.2024.116031

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Hard X-ray nanoprobe to study the emission properties of Ce-doped YAG wafer by using XEOL and TR-XEOL

Yi-Chen Li,

Tzu-Chi Huang,

Yu-Hao Wu

et al.

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Hard X-ray nanoprobe to study the emission properties of Ce-doped YAG wafer by using XEOL and TR-XEOL

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References 39 publications

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