2011
DOI: 10.1143/apex.4.062502
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Hard-X-ray Phase-Difference Microscopy with a Low-Brilliance Laboratory X-ray Source

Abstract: We have developed a hard-X-ray phase-imaging microscopy method using a low-brilliance X-ray source. The microscope consists of a sample, a Fresnel zone plate, a transmission grating, and a source grating creating an array of mutually incoherent X-ray sources. The microscope generates an image exhibiting twin features of the sample with opposite signs separated by a distance, which is processed to generate a phase image. The method is quantitative even for non-weak-phase objects that are difficult to be quantit… Show more

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Cited by 30 publications
(12 citation statements)
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“…Because of the magnification, r was much larger than the system spatial resolution and the twin feature appears, while r is smaller than the spatial resolution in normal conditions, resulting in a differential phase image. When an incoherent X-ray source, such as a rotating anode source, is used, by placing a G0 grating upstream of a sample, the same concept is implemented in a laboratory-based X-ray microscope [75]. Recently, this configuration has been realized with a commercially available X-ray microscope (ZEISS Xradia 800 Ultra, Carl Zeiss X-ray Microscopy, Inc.; CA, USA).…”
Section: X-ray Phase Microscopy and Tomographymentioning
confidence: 99%
“…Because of the magnification, r was much larger than the system spatial resolution and the twin feature appears, while r is smaller than the spatial resolution in normal conditions, resulting in a differential phase image. When an incoherent X-ray source, such as a rotating anode source, is used, by placing a G0 grating upstream of a sample, the same concept is implemented in a laboratory-based X-ray microscope [75]. Recently, this configuration has been realized with a commercially available X-ray microscope (ZEISS Xradia 800 Ultra, Carl Zeiss X-ray Microscopy, Inc.; CA, USA).…”
Section: X-ray Phase Microscopy and Tomographymentioning
confidence: 99%
“…Moving now to groundbreaking events, we would like to mention two groups of results. First, the implementation of hard-X-ray microscopy with a low-brilliance laboratory source, reported in 2011 by Kuwabara et al [ 21 ]. Second and in the opposite direction, the first steps towards hard-X-ray microscopy with free electron lasers [ 31 ].…”
Section: Overview Of Recent Progressmentioning
confidence: 99%
“…The technical evolution of zone plate devices for hard X-rays dramatically accelerated in the past two years [ 1 , 2 , 3 , 4 , 5 , 6 , 7 , 8 , 9 , 10 , 11 , 12 , 13 , 14 , 15 , 16 , 17 , 18 , 19 , 20 , 21 , 22 , 23 , 24 , 25 , 26 , 27 , 28 , 29 ]. Milestones like a lateral resolution below 10 nm, formerly a dream, appear now realistic [ 1 ].…”
Section: Introductionmentioning
confidence: 99%
“…A further class of methods includes those termed Coherent Diffractive Imaging, which seek to exploit highly coherent beams to obtain coherent diffraction patterns from small samples or small regions of a sample, enabling very high-spatial resolution information to be extracted [ 30 , 31 , 32 ]. A number of these phase-contrast methods have been applied in materials micro-tomography [ 33 , 34 , 35 , 36 , 37 , 38 , 39 ].…”
Section: Introductionmentioning
confidence: 99%