Non-Destructive Material Characterization Methods 2024
DOI: 10.1016/b978-0-323-91150-4.00013-6
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Hard X-ray photoelectron spectroscopy and X-ray diffraction techniques: non-destructive compositional, electronic, chemical and structural in-depth characterization in the tens-of-nanometer scale

Germán R. Castro,
Juan Rubio Zuazo
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