“…In the last few decades, hard X-ray microscopy has emerged as a novel method to characterize nanoscale heterogeneities in functional oxides (Holt et al, 2013;Logan et al, 2006;Hruszkewycz et al, 2013Hruszkewycz et al, , 2014Winarski et al, 2012). Specifically, hard X-ray microscopy techniques have shown certain advantages over complementary electron microscopy techniques for functional oxides, as no alterations of local boundary conditions occur during sample preparation or measurement due to comparatively weak sample-beam interaction.…”