Hard X-ray von Hamos Spectrometer for Single-Pulse Emission Spectroscopy

Anwar, Muhammad Ijaz; Ha, Sung Soo; Hwang, Byung-Jun; Han, Sang Heon; Oh, Maverick S. H.; Faiyaz, Mohd; Noh, Do Young; Kang, Hyon Chol; Kim, Sunam

doi:10.3938/jkps.75.494

Cited by 3 publications

(2 citation statements)

References 23 publications

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“…Among them, a focusing spectrometer achieves diffraction focusing at specific energies through the design of the crystal diffraction surface, thus solving the problem of low diffraction efficiency and resulting signal intensity loss. The von Hamos-type cylindrical bent crystal spectrometer, with its high collection efficiency and high scalability within its full spectral measurement range, has become an important development and application direction for focusing spectrometers [4][5][6][7][8][9][10] . Based on the cylindrical bent crystal diffraction configuration, the conical bent crystal diffraction configuration and the variable conical diffraction configuration have been developed [11][12] .…”

Section: Introductionmentioning

confidence: 99%

Planar crystal array spectrometer for simultaneous spectrum and integrated time spectrum measurement of pulse characteristic x-ray

Ma,

Hei,

Chen

et al. 2023

3rd International Conference on Laser, Optics, and Optoelectronic Technology (LOPET 2023)

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A new focusing crystal spectrometer based on a planar crystal array was developed for simultaneous diagnostics of the Xray diffraction spectrum and integrated time spectrum. In the crystal array, flat crystals were distributed in a circular shape. A coaxial annular optical fiber array was arranged perpendicular to the dispersion direction and each ring collected X-ray diffraction with different energy. The ray tracing method was used to analyze the spatial distribution of diffraction. A prototype was built and the process of X-ray pulse and the relative intensities of the characteristic X-rays Cu-Kα and Cu-Kβ were measured. The result showed that the X-ray pulse lasted about 80ns, with a rising time of 30ns. There was a plateau period of 10ns during the falling time. The intensity ratio of Cu-Kα and Cu-Kβ experienced a process of rapid descent stabilization and slow ascent, the ratio was stabilized at around 1.5 nearby the Emission intensity peak.

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Section: Introductionmentioning

confidence: 99%

Planar crystal array spectrometer for simultaneous spectrum and integrated time spectrum measurement of pulse characteristic x-ray

Ma,

Hei,

Chen

et al. 2023

3rd International Conference on Laser, Optics, and Optoelectronic Technology (LOPET 2023)

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“…XES and X-ray absorption spectroscopy (XAS) in the laboratory require very similar instrumentation and recent years have seen a fantastic increase in the application of laboratory X-ray spectroscopy (see the review by Zimmermann et al, 2020). XES finds attractive applications for time-resolved studies at synchrotrons, free-electron lasers and using pulsed laboratory sources (Alonso-Mori et al, 2012, 2015Szlachetko et al, 2014Szlachetko et al, , 2017Abraham et al, 2019;Anwar et al, 2019;Wernet, 2019;Tu et al, 2019;Miaja-Avila et al, 2016;Smolentsev et al, 2020;Vankó et al, 2013).…”

Section: Introductionmentioning

confidence: 99%

The five-analyzer point-to-point scanning crystal spectrometer at ESRF ID26

Glatzel¹,

Harris²,

Marion³

et al. 2021

J Synchrotron Rad

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X-ray emission spectroscopy in a point-to-point focusing geometry using instruments that employ more than one analyzer crystal poses challenges with respect to mechanical design and performance. This work discusses various options for positioning the components and provides the formulas for calculating their relative placement. Ray-tracing calculations were used to determine the geometrical contributions to the energy broadening including the source volume as given by the beam footprint on the sample. The alignment of the instrument is described and examples are given for the performance.

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A von Hámos spectrometer for diamond anvil cell experiments at the High Energy Density Instrument of the European X-ray Free-Electron Laser

et al. 2023

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A von Hámos spectrometer has been implemented in the vacuum interaction chamber 1 of the High Energy Density instrument at the European X-ray Free-Electron Laser facility. This setup is dedicated, but not necessarily limited, to X-ray spectroscopy measurements of samples exposed to static compression using a diamond anvil cell. Si and Ge analyser crystals with different orientations are available for this setup, covering the hard X-ray energy regime with a sub-eV energy resolution. The setup was commissioned by measuring various emission spectra of free-standing metal foils and oxide samples in the energy range between 6 and 11 keV as well as low momentum-transfer inelastic X-ray scattering from a diamond sample. Its capabilities to study samples at extreme pressures and temperatures have been demonstrated by measuring the electronic spin-state changes of (Fe0.5Mg0.5)O, contained in a diamond anvil cell and pressurized to 100 GPa, via monitoring the Fe Kβ fluorescence with a set of four Si(531) analyser crystals at close to melting temperatures. The efficiency and signal-to-noise ratio of the spectrometer enables valence-to-core emission signals to be studied and single pulse X-ray emission from samples in a diamond anvil cell to be measured, opening new perspectives for spectroscopy in extreme conditions research.

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Hard X-ray von Hamos Spectrometer for Single-Pulse Emission Spectroscopy

Cited by 3 publications

References 23 publications

Planar crystal array spectrometer for simultaneous spectrum and integrated time spectrum measurement of pulse characteristic x-ray

Planar crystal array spectrometer for simultaneous spectrum and integrated time spectrum measurement of pulse characteristic x-ray

The five-analyzer point-to-point scanning crystal spectrometer at ESRF ID26

A von Hámos spectrometer for diamond anvil cell experiments at the High Energy Density Instrument of the European X-ray Free-Electron Laser

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