In
recent years, optical pump–probe microscopy
(PPM) has
become a vital technique for spatiotemporally imaging electronic excitations
and charge-carrier transport in metals and semiconductors. However,
existing methods are limited by mechanical delay lines with a probe
time window up to several nanoseconds (ns) or monochromatic pump and
probe sources with restricted spectral coverage and temporal resolution,
hindering their amenability in studying relatively slow processes.
To bridge these gaps, we introduce a dual-hyperspectral PPM setup
with a time window spanning from nanoseconds to milliseconds and single-nanosecond
resolution. Our method features a wide-field probe tunable from 370
to 1000 nm and a pump spanning from 330 nm to 16 μm. We apply
this PPM technique to study various two-dimensional metal-halide perovskites
(2D-MHPs) as representative semiconductors by imaging their transient
responses near the exciton resonances under both above-band gap electronic
pump excitation and below-band gap vibrational pump excitation. The
resulting spatially and temporally resolved images reveal insights
into heat dissipation, film uniformity, distribution of impurity phases,
and film–substrate interfaces. In addition, the single-nanosecond
temporal resolution enables the imaging of in-plane strain wave propagation
in 2D-MHP single crystals. Our method, which offers extensive spectral
tunability and significantly improved time resolution, opens new possibilities
for the imaging of charge carriers, heat, and transient phase transformation
processes, particularly in materials with spatially varying composition,
strain, crystalline structure, and interfaces.