10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295)
DOI: 10.1109/asmc.1999.798185
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Haystack syndrome avoidance on massive correlation for probe vs. E-test data through the concurrent use of tree base models and trellis graphics. Application on sub-micron mix-signal product for the determination of the best process conditions for yield maximisation

Carlos Arturo Parra Ortega1,
Juan Ignacio Guerrero2,
E. Sobrino3
et al.
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