Head/Tape Spacing Measurements for Digital Linear Tape Drives Using Three-Color Interferometry

Tan, Sanwu; Garrettson, Brook; Talke, Frank E.; Kneeburg, Dave; Judge, John A.

doi:10.1080/10402000008982324

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Cited by 8 publications

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“…Recently, three-wavelength interferometry has been used successfully to measure the spacing for a digital linear tape interface [8] as well as a multi-module head}tape interface [9]. The correlation between head/tape spacing and asperity compliance of magnetic taper [10}12] has been investigated analytically and experimentally by using three-wavelength interferometry to measure the head/tape spacing and the contact spacing of metal particle tape as a function of contact pressure.…”

Section: Introductionmentioning

confidence: 99%