The
crystalline and morphological structures of polymer semiconducting
films were controlled by selecting appropriate thermal properties
of the polymeric chains, thereby improving polymer field-effect transistor
(FET) performances. Poly(dioctyl-quaterthiophene-dioctyl-bithiazole)
(PDQDB), comprising 5,5′-bithiazole and oligothiophene rings,
was used as the basis for the polymer semiconductor studies. The T
g and T
m values
of the thin-film state, rather than those of the bulk polymer state,
were important in this study. A PDQDB film with a T
g of 101 °C in the thin-film state showed the highest
maximum and average μFET values of 0.194 and 0.141
cm2 V–1 s–1, respectively,
in an FET device at a post-processing temperature of 100 °C.
On the other hand, relatively low average μFET values
of 0.115, 0.098, and 0.079 cm2 V–1 s–1 were observed in FET devices prepared from PDQDB
films with T
g values of 130, 165, and
180 °C, respectively, despite the dramatic increase in film crystallinity.
With the variations in μFET, what we have noticed
is that the standard deviations of the measured μFET values varied with the T
g values: 36.0%
for the T
g = 165 °C film and 51.1%
for the T
g = 180 °C film, indicating
that the organic field-effect transistors performances were not uniform.
These results were closely related to nano- and microscale nonuniformity
in the PDQDB film structure in the presence of excessively activated
grain structures. These variations were correlated with the crystalline
and morphological structures of the PDQDB films prepared under various
processing conditions.