1995
DOI: 10.1016/0168-583x(95)00324-x
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Heavy ion induced X-ray emission work at the TANDAR laboratory in Buenos Aires

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Cited by 17 publications
(3 citation statements)
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“…Three samples were collected every day from 9 a.m. to 9 p.m., in periods of 4 h each. PIXE analysis (Johansson et al, 1995) was developed at TANDAR, using 16 0 at 50 MeV (Caridi et al al., 1989;OzafrSn et al, 1993;Ozafran et al, 1995). A Si(Li) detector was used, with a resolution of about 190 eV at 5.9 keV and located at 90° with respect to the beam direction.…”
Section: Methodsmentioning
confidence: 99%
“…Three samples were collected every day from 9 a.m. to 9 p.m., in periods of 4 h each. PIXE analysis (Johansson et al, 1995) was developed at TANDAR, using 16 0 at 50 MeV (Caridi et al al., 1989;OzafrSn et al, 1993;Ozafran et al, 1995). A Si(Li) detector was used, with a resolution of about 190 eV at 5.9 keV and located at 90° with respect to the beam direction.…”
Section: Methodsmentioning
confidence: 99%
“…There is a growing interest in the use of heavy ions for analysis with particle induced X-ray emission (PIXE), as they show larger X-ray yields, thus improving PIXE sensitivity (Ozafra´n et al, 1993;Ozafra´n et al, 1995). These works have shown that a reliable knowledge of the ionization cross sections by heavy ion impact is necessary to obtain accurate results in quantitative analyses.…”
Section: Introductionmentioning
confidence: 99%
“…The concentrations in mass per unit volume of sampled air are calculated from these using the corrected flow rate, sampling time, and the areas of the deposits on the filters. The energies and photo-peaks areas of the resulting PIXE spectra were analyzed with the WinQxas 1.40 computer code developed by IAEA (with modified cross sections for 16 O at 50 MeV [26]). A standard target of the element i with an elemental thickness ðqxÞ S;i [lg/cm 2 ] gives after collection of a total chargeQ S;i :…”
Section: Pixe Measurementsmentioning
confidence: 99%