Heavy Ion Single Event Effects Performance of RadHard Devices Migrated to an Alternate Wafer Fab

Hafer, C.; Lahey, M.; Harris, D.; Larsen, Jennifer; Sievert, Fred; Sims, T. A.; Meyer, Steve; Dumitru, Radu; Jordan, A.; Milliken, Peter

doi:10.1109/redw.2010.6062506

2011 IEEE Radiation Effects Data Workshop 2011

DOI: 10.1109/redw.2010.6062506

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Heavy Ion Single Event Effects Performance of RadHard Devices Migrated to an Alternate Wafer Fab

C. Hafer

M. Lahey

D. Harris

et al.

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Heavy Ion Single Event Effects Performance of RadHard Devices Migrated to an Alternate Wafer Fab

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