Height pattern estimation for macro cells with 800MHz band in NLOS environment

Abstract

This paper evaluates the measured height pattern along an building wall in the NLOS environment in comparison with the COST-231 formula method and the typical propagation model. In addition, the measured propagation loss is compared to the propagation loss of the two-ray model composed of the diffraction path on the edge of surrounding building considering the ground-reflection which is not taken into account by the conventional model. As a result, it is confirmed that the characteristic of the measured height pattern in NLOS environment is represented by the combination of the typical and the novel propagation model.