2011
DOI: 10.1039/c1cp21652j
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Hemin interaction with bare and 4,4′-thio-bis-benzene-thiolate covered n-GaAs (110) electrodes

Abstract: Cyclic voltammetry (CV) and electrochemical impedance spectroscopy (EIS) investigations on the redox behavior of hemin at bare and 4,4'-thio-bis-benzene-thiolate (TBBT) covered n-GaAs (110) electrodes in dimethylsulfoxide (DMSO) revealed the high irreversibility of the electroreduction process, which appeared to be closely related to the stable adsorbed species strongly interfering with the electronic properties of the semiconducting substrate. The subsequent exploration of the hemin-modified electrodes by sec… Show more

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Cited by 5 publications
(4 citation statements)
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“…The iron content was determined to be 0.84 at % by XPS analysis. The Fe 2p core‐level XP spectrum displayed peaks at 709.9 and 722.1 eV, which were assigned to the BE values of Fe 2p3/2 and Fe 2p1/2 , respectively (see Figure S3 in the Supporting Information) 20a. The N 1s XP spectral region of the (DFTPP)Fe‐Im‐CNTs showed a broad nitrogen signal, which was deconvoluted into three components (Figure 3 c).…”
mentioning
confidence: 99%
“…The iron content was determined to be 0.84 at % by XPS analysis. The Fe 2p core‐level XP spectrum displayed peaks at 709.9 and 722.1 eV, which were assigned to the BE values of Fe 2p3/2 and Fe 2p1/2 , respectively (see Figure S3 in the Supporting Information) 20a. The N 1s XP spectral region of the (DFTPP)Fe‐Im‐CNTs showed a broad nitrogen signal, which was deconvoluted into three components (Figure 3 c).…”
mentioning
confidence: 99%
“…[4b,6,16] The high-resolution Fe 2p core-level XPS spectrum for the [FeTPP(Im-Ph) 2 ] + -modified sample (Figure 6a) shows major peaks at binding energy (BE) 710.0 eV (Fe-2p 3/2 ) and 723.0 eV (Fe-2p 1/2 ) and a Fe-2p 3/2 satellite at 714.4 eV. This spectrum is typical for Fe in the + 2 oxidation state, [17] indicating that reduction of the Fe centre occurs during XPS measurement. The high-resolution N 1s spectra for [FeTPP(Im-Ph) 2 ] + -modified GC (Figures 6b, c) show very clear differences between the films grafted to À 0.2 and À 0.6 V. The spectra can be fitted with 4 main peaks, listed with their assignments in Table 2.…”
Section: Composition Of Grafted Filmsmentioning
confidence: 99%
“…The lower kinetic energy of the 2p-lines considerably increases their surface sensitivity as compared to the 3d-lines. One may see that hemin adsorbed on p-GaAs(100) completely suppressed both the substrate core-level lines Ga-As (BE ¼ 1117.3 AE 0.1 eV)/As-Ga (BE ¼ 1323.4 AE 0.1 eV) [67][68][69][70] and those of Ga-O (BE ¼ 1118.5 AE 0.1 eV) and As-O (BE ¼ 1326.1 AE 0.2 eV) species, [67][68][69][70] which were replaced by two new species with higher binding energies, BE ¼ 1327.1 AE 0.1 eV and BE ¼ 1119.2 AE 0.1 eV, assigned to the carboxylate species As-COO and Ga-COO, 12 respectively. These data suggest that hemin is bound on p-GaAs(100) by its carboxyl groups, known to be responsible for the self-assembled iron porphyrins on the GaAs surfaces.…”
Section: Xps Investigationsmentioning
confidence: 99%
“…The further examination of the hemin-covered GaAs electrodes by second harmonic generation, X-ray photoelectron spectroscopy and atomic force microscopy pointed to a possible change in the spin conguration of the iron ions preceding the charge transfer step originating in the mutual interactions between solvent, hemin and surface sites. 12 Since surface states and eld effects were found to depend signicantly at GaAs electrodes on both the surface orientation and the charge carrier type, [14][15][16][17] the comparison between the redox behaviour of hemin on Siand Zn-doped GaAs(100) in the same electrolyte should give a good hint about the role played by the charge carrier type in this charge transfer process. It is the aim of this paper to present the results of our electrochemical impedance spectroscopy (EIS) and X-ray photoelectron spectroscopy (XPS) investigations in this respect.…”
Section: Introductionmentioning
confidence: 99%