2004
DOI: 10.1016/j.jcrysgro.2004.07.057
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Heteroepitaxial growth of LaAlO3 films on Si (100) by laser molecular beam epitaxy

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Cited by 23 publications
(9 citation statements)
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“…LAO has a high dielectric constant (~25 [6]), a large band-gap (5.1 eV [7]) and has been grown as amorphous [8] and epitaxial layers [9] on Si. Compared to other possible highk perovskites that have been epitaxially grown on Si, like SrTiO 3 (STO) [10], LAO has an important advantage: its band-offset with Si is 1.8 eV [11], while that of STO is virtually zero [12], which disqualifies STO as a possible gate material and questions its potential for spininjection.…”
mentioning
confidence: 99%
“…LAO has a high dielectric constant (~25 [6]), a large band-gap (5.1 eV [7]) and has been grown as amorphous [8] and epitaxial layers [9] on Si. Compared to other possible highk perovskites that have been epitaxially grown on Si, like SrTiO 3 (STO) [10], LAO has an important advantage: its band-offset with Si is 1.8 eV [11], while that of STO is virtually zero [12], which disqualifies STO as a possible gate material and questions its potential for spininjection.…”
mentioning
confidence: 99%
“…9) [41,42]. Finally, LaAlO 3 can be grown indirectly on Si by first growing a buffer layer of SrO or SrTiO 3 on Si [43][44][45][46]. Unfortunately, at present there is no experimentally verified method for depositing LaAlO 3 epitaxially and directly on Si.…”
Section: La On Simentioning
confidence: 99%
“…Efforts to grow other epitaxial complex oxide/ silicon interfaces, in particular LaAlO 3 /Si, which is highly desirable because of its larger band gap and favorable band alignments (as per Sect. 2.5), have so far been unsuccessful without an intervening buffer layer between the silicon and the oxide [43][44][45][46]. An in-depth experimental review of progress in the growth of complex oxides on silicon can be found in Ref.…”
Section: Previous Experimental Workmentioning
confidence: 99%
“…Epitaxial LAO films on STO-buffered Si(001) substrates have been grown by molecular beam epitaxy (MBE) at high temperature (> 600 °C). [10][11][12] However, the STO/Si interface is not stable above 600 °C, and oxygen present in the MBE-deposited STO can lead to the formation of an amorphous SiO x , or silicate layer at the STO/Si interface at high temperature. [11][12][13][14] Growth of oxide films by atomic layer deposition (ALD) may offer several advantages when compared to MBE and pulsed laser deposition, such as uniform deposition over large area substrates, good conformality and compatibility with current processing tools.…”
Section: Introductionmentioning
confidence: 99%