2017 IEEE 67th Electronic Components and Technology Conference (ECTC) 2017
DOI: 10.1109/ectc.2017.240
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Heterogeneous Integration at Fine Pitch (≤ 10 µm) Using Thermal Compression Bonding

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Cited by 70 publications
(35 citation statements)
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“…An array of pillars with 5 µm diameter copper pillars was built on each chiplet and pillars on each pillar row was connected using a serpentine structure through the SiIF (shown in Figure 1(c)) to check for electrical continuity across the chiplet. Electrical tests on early test prototypes have shown >97% yield with low contact resistance of about 42 mΩ for 5 µm diameter copper pillars [16]. The average sheer strength of our metalmetal bonds was found to be higher than that of state-ofthe-art Sn-capped copper pillar bonds with annealing time of ~6 min.…”
Section: Siif Technologymentioning
confidence: 95%
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“…An array of pillars with 5 µm diameter copper pillars was built on each chiplet and pillars on each pillar row was connected using a serpentine structure through the SiIF (shown in Figure 1(c)) to check for electrical continuity across the chiplet. Electrical tests on early test prototypes have shown >97% yield with low contact resistance of about 42 mΩ for 5 µm diameter copper pillars [16]. The average sheer strength of our metalmetal bonds was found to be higher than that of state-ofthe-art Sn-capped copper pillar bonds with annealing time of ~6 min.…”
Section: Siif Technologymentioning
confidence: 95%
“…The average sheer strength of our metalmetal bonds was found to be higher than that of state-ofthe-art Sn-capped copper pillar bonds with annealing time of ~6 min. More details regarding fabrication process steps of the SiIF substrate and metal-to-metal bonding used can be found in [16]. [16] (c) Serpentine test structure with 5 µm diameter pillar Figure 1(a) shows a schematic cross-section of SiIF based system assembly.…”
Section: Siif Technologymentioning
confidence: 99%
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“…Integrating four channels per Chiplet alleviates overhead from the bondpads, and facilitates assembly while offering a suitably fine-grained implementation. More aggressive fine-pitch bondpad schemes are possible with advanced processing techniques [23]. From a circuit perspective, potential limitations stem from parasitic capacitance incurred by bondpads, ESD diodes, and routing in the RDL.…”
Section: A Architecture and Physical Integrationmentioning
confidence: 99%
“…The Chiplets are integrated with the microelectrode array through thermal compression flip-chip bonding [23], [24] onto redistribution layers (RDLs) on the backside of the array, which support chip-scale routing with low parasitics. The RDLs are fabricated with back-end-of-line techniques used for silicon interposers [22].…”
Section: A Architecture and Physical Integrationmentioning
confidence: 99%