2015
DOI: 10.1103/physrevb.92.045306
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Hexagonal indium double layer onSi(111)7×3

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Cited by 13 publications
(15 citation statements)
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“…For 2.4 ML we found that "rect" is the most stable configuration with formation energy~74 meV per unit cell lower than the "hex" phase. Our result agrees with a previous first-principles study by Park and Kang [23], which predicted that the "rect" model is 0.05 eV more stable than the "hex" one. This indicates that In on Si(111)-√7 × √3 forms a double layer structure with 2.4 ML coverage, and only the "rect" phase exists.…”
Section: Resultssupporting
confidence: 93%
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“…For 2.4 ML we found that "rect" is the most stable configuration with formation energy~74 meV per unit cell lower than the "hex" phase. Our result agrees with a previous first-principles study by Park and Kang [23], which predicted that the "rect" model is 0.05 eV more stable than the "hex" one. This indicates that In on Si(111)-√7 × √3 forms a double layer structure with 2.4 ML coverage, and only the "rect" phase exists.…”
Section: Resultssupporting
confidence: 93%
“…5(b) and 5(c)) between the In-In (2.40 Å for "rect" and 2.45 Å for "hex") and In-Si layers (2.58 Å for "rect" and 2.59 Å for "hex") are in close agreement with the values reported by Park and Kang [23], namely 2.42/2.60 Å for "rect" and 2.47/2.61 Å for "hex". We found, however, a significant difference in height of the top-layer In atoms in the "hex" phase when compared to the "rect" phase: while in the "rect" configuration the heights of the top-layer In atoms differ from each other by less than 0.05 Å, in the "hex" configuration the difference in height ranges from 0.05 to 0.20 Å.…”
Section: Resultssupporting
confidence: 89%
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