Photodiodes - World Activities in 2011 2011
DOI: 10.5772/20587
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HgCdTe Heterostructures Grown by MBE on Si(310) for Infrared Photodetectors

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Cited by 2 publications
(4 citation statements)
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“…Moreover, the longwave shift of the "red" boundary with temperature decrease corresponds to temperature narrowing the MCT bandgap. The electron component of detector sensitivity reaches its maximum value for the time that corresponds well to the lifetime of photogenerated charge carriers in MCT crystal (∼10 at 300 K [2]), whereas the time scale of thermal effects is slower: their characteristic time constant is larger than 10 . In our experiments, the time for which the detector surface was exposed to photons was .…”
Section: Discussionmentioning
confidence: 99%
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“…Moreover, the longwave shift of the "red" boundary with temperature decrease corresponds to temperature narrowing the MCT bandgap. The electron component of detector sensitivity reaches its maximum value for the time that corresponds well to the lifetime of photogenerated charge carriers in MCT crystal (∼10 at 300 K [2]), whereas the time scale of thermal effects is slower: their characteristic time constant is larger than 10 . In our experiments, the time for which the detector surface was exposed to photons was .…”
Section: Discussionmentioning
confidence: 99%
“…To decrease the influence of surface recombination, MCT layers were grown with x increasing in direction to the surface [2]. Close to the buffer layer, the Cd content also increases, and a potential barrier can be formed in some cases between the buffer and photosensitive layers.…”
Section: Mct-based Heterostructures Growthmentioning
confidence: 99%
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“…The MCT-based heterostructure, shown in Fig. 1 [15]. To decrease the influence of surface recombination, MCT layers were grown with the Cd content increasing to the surface.…”
Section: Experimental: Mct-based Heterostructure Growth and Charactermentioning
confidence: 99%