2012
DOI: 10.1088/0960-1317/22/9/095012
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High-bandwidth piezoresistive force probes with integrated thermal actuation

Abstract: We present high-speed force probes with on-chip actuation and sensing for the measurement of pN-scale forces at the microsecond time scale. We achieve a high resonant frequency in water (1–100 kHz) with requisite low spring constants (0.3–40 pN/nm) and low integrated force noise (1–100 pN) by targeting probe dimensions on the order of 300 nm thick, 1–2 μm wide and 30–200 μm long. Forces are measured using silicon piezoresistors while the probes are actuated thermally with an aluminum unimorph and silicon heate… Show more

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Cited by 24 publications
(35 citation statements)
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“…We calibrated each cantilever via Laser Doppler Vibrometry to determine its resonant frequency (f0, Hz) and spring constant (k, N/m) 28,29 .…”
Section: Hawk Hardwarementioning
confidence: 99%
“…We calibrated each cantilever via Laser Doppler Vibrometry to determine its resonant frequency (f0, Hz) and spring constant (k, N/m) 28,29 .…”
Section: Hawk Hardwarementioning
confidence: 99%
“…Tosolini et al [49] achieved a resolution of about 40 pN with cantilevers of 250 lm length  8 lm width (with 2 lm leg width)  0.45 lm thickness. Doll and Pruitt [50] achieved resolutions of 8-40 pN with probes of 35-100 lm length  1 lm width  0.30 lm thickness.…”
Section: Electromechanical Response Of Piezoresistive Cantileversmentioning
confidence: 99%
“…An additional advantage of N-type doping is that the maximum N-type piezoresistive coefficient (in the (1 0 0) direction) is a factor of 1.4 greater than the maximum for P-type (in the (1 1 0) direction). Indeed, Doll and Pruitt [50] used relatively low temperature phosphorus doping to define N-type piezoresistors on thin (300 nm) cantilevers for force probes. One can directly take advantage of the higher G factor for N-type doping if a V-shaped cantilever geometry at 45°is used.…”
Section: Cantilever Fabricationmentioning
confidence: 99%
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“…Piezoelectric and piezoresistive sensing, on the other hand, enable integration of sensing elements on the AFM cantilevers which significantly simplifies the experimental setup by eliminating the need for external sensing elements, precise system alignment and complex circuitry for operation [6]. However, such methods require complex fabrication processes and cannot compete with some of the conventional technologies in terms of sensitivity [6]- [8]. Taking advantage of high performance of microscale rotational mode disk resonators in liquid, this work presents an integrated and convenient (with fully electronic readout) force-displacement measurement technique that can be deployed in various environments (vacuum, air, and liquid) with higher sensitivities.…”
Section: Introductionmentioning
confidence: 99%