2018
DOI: 10.1109/led.2018.2795039
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High-Density NAND-Like Spin Transfer Torque Memory With Spin Orbit Torque Erase Operation

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Cited by 132 publications
(41 citation statements)
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“…Three‐terminal SOT–MTJ, with separated channels for writing and reading operations using SOTs and TMR, respectively, have many advantages for application: low power consumption, ultrafast writing (sub‐ns reversal), and high reliability . In addition, combining the SOTs and STT can overcome major drawbacks of the conventional STT–MRAM and SOT–MRAM . Erasing by SOTs and programming by STT offer a new path to design spin memory devices.…”
Section: Manipulation Of Magnetic Materials By Spin–orbit Torquesmentioning
confidence: 99%
“…Three‐terminal SOT–MTJ, with separated channels for writing and reading operations using SOTs and TMR, respectively, have many advantages for application: low power consumption, ultrafast writing (sub‐ns reversal), and high reliability . In addition, combining the SOTs and STT can overcome major drawbacks of the conventional STT–MRAM and SOT–MRAM . Erasing by SOTs and programming by STT offer a new path to design spin memory devices.…”
Section: Manipulation Of Magnetic Materials By Spin–orbit Torquesmentioning
confidence: 99%
“…FeRh has stood out as a highly intriguing material for applications in heatassisted magnetic recording 2,3 . Nowadays, with the rapid development of AFM spintronics aimed at low power and ultrafast logic devices [4][5][6][7][8][9] , FeRh attracts renewed interest as a unique AFM due to its particular physical properties during the phase transition. Benefiting from the ability to grow thin films of high quality, intensified functional devices based on the phase transition of FeRh have been proposed [10][11][12][13][14][15] .…”
mentioning
confidence: 99%
“…The fundamental reason is: changing the current direction only induces the inversion of the sign of spin polarization vectors ( + or − ), but + and − are symmetrical with respect to . Thus the direction of the write current can be fixed if the proposed device is used for designing the MRAM, which helps in eliminating the source degeneration issue of the access transistor [34,35]. Another two conclusions can be drawn from Figure 1(b).…”
Section: Simulation Modelsmentioning
confidence: 85%