Origin of efficiency roll-off in phosphorescent organic light-emitting diodes was investigated with triplet mixed host devices and stable devices with little efficiency roll-off was developed. Efficiency roll-off was significant in the device with narrow recombination zone ͑RZ͒ and charge leakage out of emitting layer at high luminance was critical to efficiency roll-off. Efficiency roll-off could be reduced in triplet mixed host device with broad RZ and little charge leakage at high driving voltage. Triplet mixed host devices with an exciton blocking layer showed a quantum efficiency over 90% of maximum quantum efficiency at a luminance of 20 000 cd/ m 2 . © 2008 American Institute of Physics. ͓DOI: 10.1063/1.2836270͔ Phosphorescent organic light-emitting diodes ͑PHOLEDs͒ have a merit of high quantum efficiency and 100% theoretical maximum quantum efficiency was already reported. 1 However, quantum efficiency of PHOLEDs tends to decrease at high current density because of triplet-triplet exciton quenching mainly originated from long triplet excited lifetime of phosphorescent emitting materials. 2,3 There have been many studies on the origin of efficiency roll-off in PHOLEDs. Triplet-triplet annihilation at high current density was the main reason for the efficiency roll-off and it was proportional to the square of triplet exciton density. 4,5 Triplet-polaron quenching was reported to be responsible for triplet efficiency roll-off through triplet energy transfer to charged molecules. 3 The triplet-polaron quenching scales with triplet exciton density and its effect was not so significant as triplet-triplet quenching. Baldo et al. proposed that triplet-triplet annihilation is the main mechanism for efficiency decrease at high luminance. 3 In addition to triplet-triplet annihilation and triplet-polaron quenching, dissociation of excitons into free charge carriers contributes to efficiency decrease at high current density. 6 These triplet quenching processes mentioned above can be correlated with device structures and triplet devices with long triplet excited state lifetime showed serious triplet-triplet exciton quenching and narrow emission zone was found to have negative effect on triplet-triplet quenching because triplet exciton density is high in the exciton formation zone. [7][8][9] Even though there have been some experimental studies about efficiency roll-off of PHOLEDs, there has been no systematic study about the relationship between efficiency roll-off and device structures. In this work, triplet efficiency roll-off was studied using triplet mixed host devices and the origin of the triplet efficiency decrease at high luminance was revealed by monitoring recombination zone ͑RZ͒ of triplet mixed host devices according to driving voltage.Triplet mixed host device structures used in this work were indium tin oxide ͑150 nm͒ / N , NЈ-diphenyl-nm͔/light emitting layer ͓͑EML͒, 30 nm͔/2, 9-dimethyl-4, 7-diphenyl-1, 10-phenanthroline ͓͑BCP͒ 5 nm͔/tris͑8-hydroxyquinoline͒ aluminium ͑20 nm͒ / LiF ͑1 nm͒ / Al ͑200 nm͒...