Abstract-We present an analytical approach to accurately model the phase sensitivity, and provide simple analytical formulae, useful in the design, comparison and optimization of multiplexed amplified interferometric fiber-optic based sensor systems. The phase sensitivity model incorporates the various key noise contributions including receiver noise, amplified spontaneous emission (ASE) induced noise, active sources noise and other phase noise terms. We define and present a novel term 'Demod phase sensitivity' to take into account the effects from noise aliasing in systems based on time division multiplexed (TDM) architectures. An experiment was conducted that confirmed the appropriateness and accuracy of the phase sensitivity model. The approach is widely applicable but particular appropriate for fiber-optic sensor systems using amplifiers and TDM.Index Terms-Phase noise model, phase sensitivity, interferometric fiber optic sensor, amplified array, TDM, noise aliasing, derivative approach
I. INTRODUCTIONInterferometric fiber optic sensors have been researched for nearly four decades, the interest driven by a number of practical applications, particularly in military sonar and in seismic surveying [1]. Fiber sensors provide many advantages over conventional electro-ceramic-based sensors, including their immunity to electromagnetic interference, high sensitivity, simplicity, smaller cross-section, potential lower cost, multiplexing capability and especially their reliability in underwater applications.Interferometric fiber optic acoustic sensors are based on measuring the phase change of light travelling in an optical fiber due to the strains developed on the fiber by an applied measurand. The non-linear response between the optical phase modulation and the intensity output of the interferometer is linearized by methods including both feedback and open-loop demodulators [2]. The performance of any demodulation scheme is always limited by various types of intensity or phase noise such as shot noise, thermal fluctuations, optical source noise, electronic drift and other system specific sources 1 Manuscript