IEEE Open J. Ind. Applicat.
 2024
DOI: 10.1109/ojia.2024.3409153
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High-Energy Dynamic Avalanche to Failure by Incremental Source-Voltage Increase in Symmetric Double-Trench & Asymmetric Trench SiC MOSFETs

Mana Hosseinzadehlish,
Saeed Jahdi,
Xibo Yuan
et al.
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