High energy electron effects on charge injection devices

Miller, Kyle B.; Duncan, M. M.; Houten, C. van; Carbone, Joseph

doi:10.1109/redw.2000.896283

Cited by 1 publication

(2 citation statements)

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“…Nevertheless, extensive CID radiation studies [17][18][19] have been continued. Recently high-energy electron testing of CID22Q has been reported [20]. The goal was to measure transient effects utilizing both 10 and 68 MeV electrons, as well as TID responses with 30 MeV electrons.…”

Section: Cidmentioning

confidence: 99%

“…Each device was operated as a framing camera during the irradiation. Though data showed a significant increase in the dark current and excessive read noise, the device was still able to operate as a video camera after receiving a TID of 1 Mrad (Si) [20]. Figure 3 provides values of the dark current for the CID-based cameras irradiated in a stepped fashion up to 500 krad (Si) and 1Mrad (Si), respectively.…”

Section: Cidmentioning

confidence: 99%

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Star Tracker Focal Plane Evaluation for the JIMO Mission

Jerebets

2006 IEEE Aerospace Conference

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The Jupiter Icy Moon Orbiter (JIMO) mission 1 was planned as the first implementation of Prometheus, an ambitious space exploration project proposed by NASA. The mission would provide a rigorous scientific investigation of Jupiter and three of its moons Callisto, Ganymede, and Europa. To safely and efficiently power and maneuver the spacecraft in deep space, novel technologies would be incorporated. 12 Though launch is currently indefinitely postponed, this mission, as conceived, already presents a significant technical challenge for a robust Attitude Control System (ACS) design due to severe radiation environment of the Jovian system, and because navigation sensors must survive and function properly throughout the mission. It is particularly relevant to a spacecraft's ACS that relies on star trackers for an accurate attitude determination. A star tracker focal plane is very susceptible to impinging charged particles and cosmic gamma rays. The radiation will degrade the device performance through false signal appearance and increased noise.

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