The challenging issues in conventional microfabrication of SiC pressure sensor diaphragms from bulk wafers are low etch rates, thicker (>40 µm) diaphragms, low spatial resolutions, rough surfaces and substantial contamination. In via hole drilling of SiC, the critical concern is the low drilling speed (nm per minute). In this work, femtosecond (fs)-pulsed laser ablation was conducted to overcome some of these deficiencies. Circular diaphragms (0.5 to 1 mm) by trepanning mode and via holes (30-50 µm) by percussion drilling mode were micromachined in 250 µm thick 4H-SiC single crystals using an 800 nm wavelength, 120 fs, 1 mJ Ti:sapphire laser. Pulse energy, number of pulses and scan rate were varied to obtain a high etch rate and high quality features. Results showed that the etch rates are 2-10 µm per pulse, diaphragm thicknesses are 20-200 µm, surface roughness is 1-2 µm Ra and via hole drilling speeds are up to 25 µm per second. The etch depth control was well within ± 1%. High aspect ratio features with excellent spatial resolutions were obtained due to the absence of thermal damages such as a recast layer and contamination. Thus, femtosecond-pulsed laser ablation by virtue of its unique characteristics such as multiphoton ionization and the absence of lattice heating offers high speed, precision and accuracy in micromachining 4H-SiC wafers.