2018 25th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD) 2018
DOI: 10.23919/am-fpd.2018.8437384
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High Field-Effect Mobility Amorphous Indium-Tin-Zinc-Oxide Thin-Film Transistors Using Negatively Charged Aluminium-Oxynitride Gate Dielectrics

Dongsuk Shin
1
,
Kyungsoo Jang
2
,
Cam Phu Thi Nguyen
3
et al.
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