2022
DOI: 10.1002/pssr.202200204
|View full text |Cite
|
Sign up to set email alerts
|

High‐Field Electron‐Drift Velocity in n‐Type Modulation‐Doped GaAs0.96Bi0.04 Quantum Well Structure

Abstract: The drift velocity (vdrift) of electrons in an n‐type modulation‐doped GaAs0.96Bi0.04/Al0.15Ga0.85As quantum well (QW) structure is determined for electric fields (F) ranging from ≈0.4 to 3.58 kV cm−1. The resulting vdrift characteristic exhibited a linear increase and reached ≈6 × 106 cm s−1 at low electric fields then almost saturated with increasing electric field. The electron drift mobility is determined as 2265 cm2 Vs−1 in the regime where the drift velocity is linear with respect to the electric field. … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
2
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 6 publications
(2 citation statements)
references
References 28 publications
0
2
0
Order By: Relevance
“…According to the following equations, the refractive index of both SnNc/Glass and SnNc/p-Si can be estimated [48,49]: Figure 4 shows the temperature-dependent I-V characteristic of the SnNc/p-Si device under dark conditions. The maximum value of the current value in I-V measurement is kept lower to hinder the heating of the free carrier and photo-generated carrier during the measurement [50][51][52]. A depletion region is formed at the SnNc/p-Si interface, as concluded from the rectification behavior in I-V characteristics curves.…”
Section: Resultsmentioning
confidence: 99%
“…According to the following equations, the refractive index of both SnNc/Glass and SnNc/p-Si can be estimated [48,49]: Figure 4 shows the temperature-dependent I-V characteristic of the SnNc/p-Si device under dark conditions. The maximum value of the current value in I-V measurement is kept lower to hinder the heating of the free carrier and photo-generated carrier during the measurement [50][51][52]. A depletion region is formed at the SnNc/p-Si interface, as concluded from the rectification behavior in I-V characteristics curves.…”
Section: Resultsmentioning
confidence: 99%
“…
the high tunability of the bandgap modifying valence band (VB) structure without compromising the electronic charge transport in the conduction band (CB) [8][9][10][11][12][13]. The strong Bi-dependence of all VBs (heavy and light hole and spinorbit bands) has revealed that the potential of Bi-containing alloys not only suppress Auger recombination in semiconductor lasers but also to be used in NIR and MIR applications [14].
…”
mentioning
confidence: 99%