FeCo/Ru/FeCo exchange coupled synthetic antiferromagnetic multilayers were prepared with two sputtering modes. One is continuous sputtering mode, and the other is layer-by-layer sputtering mode. The former mode implies that the growth of entire FeCo layer has no intervals; while the latter implies that the growth of entire FeCo has many intervals. It is found that the exchange coupling filed H ex of sample sputtered by layer-by-layer mode is higher than the one sputtered by continuous mode.Magnetic properties of samples deposited by layer-by-layer mode were studied versus sputtering power. we can conclude that the bilinear exchange constant increases and the biquadratic exchange constant decreases with the increase of the sputtering power.The magnetization reversal process was studied by the MFM measurement. We can get that the magnetization reversal process is a domain wall move process. When the applied field is smaller than H ex, both the two magnetic layers have same domain structure and the domain structure of the two layers are reverse correspondingly. It is also found that when the applied field is smaller than H ex and changing the domain wall of the two layers move correspondingly at the same time. From MFM measurement of exchanging coupling square elements we can conclude that the single domain size of SAF multilayers is larger than 5μm when the applied magnetic field is smaller than the H ex. 0018-9464 (c)
Index Terms-Magnetic domains, Magnetic force microscopy, Magnetization reversal, Synthetic antiferromagnetic multilayers