2011
DOI: 10.1080/00150193.2011.577308
|View full text |Cite
|
Sign up to set email alerts
|

High Frequency Measurements of Ferroelecrics and Related Materials in Coaxial Line

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
12
0

Year Published

2014
2014
2020
2020

Publication Types

Select...
6
1

Relationship

1
6

Authors

Journals

citations
Cited by 23 publications
(12 citation statements)
references
References 0 publications
0
12
0
Order By: Relevance
“…(iii) 1 MHz-1 GHz band: the complex reflection coefficient was measured with Agilent 8714ET vector network analyzer. The multimode capacitor model was used to calculate the real and imaginary parts of complex dielectric permittivity 66 . (iv) 26-50 GHz band: the scalar transmission and reflection coefficients were measured in a waveguide system.…”
Section: Methodsmentioning
confidence: 99%
“…(iii) 1 MHz-1 GHz band: the complex reflection coefficient was measured with Agilent 8714ET vector network analyzer. The multimode capacitor model was used to calculate the real and imaginary parts of complex dielectric permittivity 66 . (iv) 26-50 GHz band: the scalar transmission and reflection coefficients were measured in a waveguide system.…”
Section: Methodsmentioning
confidence: 99%
“…The Agilent 8714ET vector network analyzer was used for this purpose. The dielectric permittivity can be obtained according to the elementary theory of transmission lines which can be found elsewhere [11].…”
Section: Dielectric Spectroscopymentioning
confidence: 99%
“…It is easy to show that (8) and (9) Sign // in (8) Parasitic inductance is considered to be a function of the sample radius , whereas the parasitic and fringe capacitances are functions of the sample length (we used mm). If the radius of the inner conductor , as a first approximation one can consider (10) where and -constants, which can be obtained experimentally by performing measurements of samples with different dimensions and known parameters. The second way to obtain the shapes of all three unknown dependences is electrodynamic modeling of the MC employing specialized software.…”
Section: Model Of the Measurement Circuitmentioning
confidence: 99%
“…This is especially important in the gigahertz frequency range. Furthermore, this model takes into account the distribution of the electromagnetic field in the measuring capacitor (MC) without solving a complicated electrodynamics problem, which generally involves complex calculations (e.g., [9] and [10]). The only feature of this method, which, in some particular cases, could be considered as a shortcoming, is that it requires the knowledge of a full two-port scattering matrix.…”
Section: Introductionmentioning
confidence: 99%