2018 International Conference on Electrical Sciences and Technologies in Maghreb (CISTEM) 2018
DOI: 10.1109/cistem.2018.8613583
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High Impedance Faults Location in the Distribution Networks using Adaptive Neuro-Fuzzy Inference System

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Cited by 7 publications
(3 citation statements)
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“…Nevertheless, using this signal requires specific devices for the measurements, as it is not usual in protection schemes. V and I 128 samples per cycle EMTP b -RV [20] V and I 64 samples per cycle ATP [11] V and I 256 samples per cycle ATP [10] V and I 8000 samples per second ATP/Matlab [23] V and I 192 samples per cycle ATP/Matlab [21] V and I * Simulink/Matlab [12] V and I * ATP/Matlab [14] V and I 0 to 100 kHz * [7] V and I * * [13] V Table 2 also shows different sampling frequencies used in HIFLMs. When using a low sampling rate, only the HIF characteristics that impact the signal's low-frequency components can be analyzed.…”
Section: Hif Representation Referencementioning
confidence: 99%
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“…Nevertheless, using this signal requires specific devices for the measurements, as it is not usual in protection schemes. V and I 128 samples per cycle EMTP b -RV [20] V and I 64 samples per cycle ATP [11] V and I 256 samples per cycle ATP [10] V and I 8000 samples per second ATP/Matlab [23] V and I 192 samples per cycle ATP/Matlab [21] V and I * Simulink/Matlab [12] V and I * ATP/Matlab [14] V and I 0 to 100 kHz * [7] V and I * * [13] V Table 2 also shows different sampling frequencies used in HIFLMs. When using a low sampling rate, only the HIF characteristics that impact the signal's low-frequency components can be analyzed.…”
Section: Hif Representation Referencementioning
confidence: 99%
“…V magnitude V measurements [21] I and V magnitude Measurement relay [12] R-squared of the fitted lines I and V-lines modeling [7] Voltage and current RMS e and phase PMU i [11] LSE f and steps descent I and V [14] Impulse between devices Power line comunication [16] Low V unbalance Smart meters [24] Magnetic field's high-frequency phase Magnetic field sensor WT due to the narrow high-frequency support and subjective selection of the mother wavelet. Also, there is a resolution loss since the signal's samples are divided by two at each decomposition level [25], [36].…”
Section: Stage Iii: Metrics Used In Hiflmsmentioning
confidence: 99%
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